Qingdao University of Technology 中文版

Facilities >>Scanning Electron Microscope(SEM)

Scanning Electron Microscope(SEM)


Model: Hitachi S-3500N

Specifications:

Resolution(SE image): 3.0 nm(30KV), 10 nm (3KV)

Resolution(BSE image): 4.0 nm(30KV)

Model: Hitachi S-3500N

Magnification: 5-300 000